Keithley 4200-SCS User Manual

4-32 Return to Section Topics 4200-900-01 Rev. K / February 2017
Section 4: How to Control Other Instruments with the Model 4200-SCS Model 4200-SCS User Manual
Description of tests
First connect test
The first test, connect, is a UTM that connects the device to the four SMUs. In the project
navigator, double-click the first connect UTM to open it. Figure 4-47 shows the parameters that
connect the device to the SMUs.
NOTE The first parameter (line 1) opens any relays that may have been closed by a previous
test.
For the other parameter shown in Figure 4-47, the device connects to the SMUs as shown in
Figure 4-48. For details about the connect UTM, refer to the Reference Manual, Appendix A,
Creating Project Prompts.
Figure 4-47
First connect test: Connects the device to the SMUs
Figure 4-48
Signal paths for the pre- and post-stress tests
First id-vg test
The id-vg ITM measures the transfer characteristics of the N-channel MOSFET. The I
D
vs. V
G
data points are graphed. The test also calculates and graphs transconductance. This is the
before-stress characterization test.
Connects SMU1 to pin 3 of test fixture
Connects SMU2 to pin 4 of test fixture
Connects SMU3 to pin 5 of test fixture
Connects SMU4 to pin 6 of test fixture
Opens all relays
Gate
Source
Drain
Substrate
N-Channel
MOSFET
SMU1
SMU2
SMU3
1
2
3
4
5
6
A
B
C
D
E
F
GND
SMU4
PGU
LO

Keithley 4200-SCS Specifications

General

Brand	Keithley
Model	4200-SCS
Category	Semiconductors
Language	English