Keithley 4200-SCS User Manual

3-6 Return to Section Topics 4200-900-01 Rev. K / February 2017
Section 3: Common Device Characterization Tests Model 4200-SCS User’s Manual
Three terminal NPN BJT tests
The following tests require three SMUs (see Figure 3-3).
Figure 3-3
Three terminal NPN BJT tests
Description of three terminal NPN BJT tests:
vce-ic:
This test runs nested I-V sweeps to generate an n-p-n transistor collector family of
curves. Collector current is plotted vs. collector voltage.
gummel:
This test runs two voltage sweeps on the collector and base to produce a classic n-p-n
transistor Gummel plot.
vc-sat:
This test runs a voltage sweep on the collector, uses formulator functions to calculate
ICSAT and VCSAT, and plots a collector I-V curve to show the n-p-n transistor
saturation voltage.

Keithley 4200-SCS Specifications

General

Brand	Keithley
Model	4200-SCS
Category	Semiconductors
Language	English