Keithley 4200-SCS User Manual

3-146 Return to Section Topics 4200-900-01 Rev. K / February 2017
Section 3: Common Device Characterization Tests Model 4200-SCS User’s Manual
VPU channels will not be inadvertently connected to a device terminal when the
SMU testing is performed.
Figure 3-121
FlashEndurance-Switch project
Running a FlashEndurance or FlashDisturb project
This section explains how to use the following Flash projects:
• FlashEndurance-NAND
• FlashEndurance-NOR
• FlashEndurance-Switch
• FlashDisturb-NAND
• FlashDisturb-NOR
• FlashDisturb-Switch
These Flash projects use a small number of tests and methods. This section will
explain the tests and how to set parameter values for Endurance testing or
Disturb testing.
Before using any of these projects, determine the appropriate pulse voltages and
widths by first using the appropriate project, using the procedures in Running the
Flash-NAND, Flash-NOR or Flash-Switch Project.
The Endurance and Disturb projects include everything from the corresponding
Flash-NAND, Flash-NOR, or Flash-Switch projects. To use an Endurance or
Disturb test, ensure that each test in the project navigator is functioning properly
by following the procedures below. After setting up all of the tests, the information
below will continue to explain the setup for the stress / measure looping that is the
core of any endurance or disturb test.

Keithley 4200-SCS Specifications

General

Brand	Keithley
Model	4200-SCS
Category	Semiconductors
Language	English