Keithley 4200-SCS User Manual

3-32 Return to Section Topics 4200-900-01 Rev. K / February 2017
Section 3: Common Device Characterization Tests Model 4200-SCS User’s Manual
Figure 3-27
Side view of scope card connections
Model 8101- PIV test fixture
The 4200-PIV-A includes a test fixture and DUTs to verify proper PIV-A setup and
operation, and is also useful for troubleshooting.
The test fixture, 8101-PIV (shown in Figure 3-28), has two electrically separate
sockets to support testing three and four leaded devices. The lower socket,
located near the latch, is for DC testing with SMUs and uses four Triax
connectors. The upper, or back, socket, located near the hinge, is for Pulse IV or
Pulse IV + DC testing and uses two SMA connectors.
The SMU socket has a triax connector for each of the four DUT pins. The pulse
socket uses only two SMA connectors, where the DUT source and bulk
connections are connected to ground (SMA coax shield) and are optimized for
use with the 4200-PIV-A package.
The fixture may also be used with the 4200-PIV-Q package, but higher power
testing, either DC or pulse IV, requires additional care to prevent damage to the
included DUTs. The schematic of the 8101 test fixture is shown in Figure 3-29.
The tests included in both the PulseIV-Complete and PulseIV-Demo projects have
parameter defaults that provide reasonable results with the included DUT (metal
can TO-72, SD-210 nMOS FET).

Keithley 4200-SCS Specifications

General

Brand	Keithley
Model	4200-SCS
Category	Semiconductors
Language	English