Keithley 4200-SCS User Manual

4-34 Return to Section Topics 4200-900-01 Rev. K / February 2017
Section 4: How to Control Other Instruments with the Model 4200-SCS Model 4200-SCS User Manual
pgu1-setup test
In the project navigator, double-click pgu1-setup to open the test. The complete parameter listing
for the test is shown in Figure 4-52. These parameters to configure the PGU are explained in the
description area of the definition tab.
Figure 4-52 shows the pulse that is configured by this test.
Figure 4-52
PGU stress pulse specifications
NOTE The pulse is not drawn to scale.
pgu-trigger test
In the project navigator, double-click pgu-trigger to open the test. The two-line parameter list for
this test is shown in Figure 4-53. This test triggers the PGU to output 60,000 pulses to the
N-channel MOSFET.
Figure 4-53
pgu-trigger test: Trigger the burst of stress pulses
Third connect test
This connect test is the same as the first connect test. It connects the device to the SMUs so that
the transfer characteristics can be determined after applying the pulse stress (see Figure 4-47 and
Figure 4-48).
Second id-vg test
This id-vg test is the same as the first id-vg test. It measures the transfer characteristics of the
N-channel MOSFET. This is the after-stress characterization test.
Rise
Time
(100ns)
Fall
Time
(100ns)
Width
1
µ s
Period
5
µ s
Base Value
(0V)
Amplitude
(3.5V)
Triggers burst of pulses

Keithley 4200-SCS Specifications

General

Brand	Keithley
Model	4200-SCS
Category	Semiconductors
Language	English