Keithley 4200-SCS User Manual

4200-900-01 Rev. K / February 2017 Return to Section Topics 3-71
Model 4200-SCS User’s Manual Section 3: Common Device Characterization Tests
Figure 3-54
Specifying timing (linear and log) for stress / measure mode
Want logarithmic or linear stress
Log: After first stress cycle all tress
times increase logarithmically.
Linear: After first
stress cycle, all stress
times are identical
Specify
Linear.
Specify the
amount of time
(seconds) that
devices are
stressed
during 1st
Specify the
total stress
time for the
entire Subsite
Plan.
Specify the
total number
of stresses
(128,
If needed, specify a measurement
delay (seconds) after each stress
interval to allow each device to
equilibrate before measuring its
KITE calculates cumulative stress
times for the cycles (seconds),
based on the values that you enter
(First Stress Time, Last Stress
Time, and son on).
Specify
Log.
Specify the
amount of time
(seconds) that
devices are
stressed
during 1st
Specify total
amount of time
(seconds) that
devices are
stressed
during the
Specify the
number of
stresses in
each decade>
(128 stresses
allowed,
maximum, in
all decades
combined).
See the
simpler
example at
right: four
decades of
stress times
If needed, specify a measurement delay
(seconds) after each stress interval to
allow each device to equilibrate before
measuring its parameters.
KITE calculates cumulative stress
times for the cycles (seconds),
based on the values that you enter
(First Stress Time, Total Stress
Time, and so on).
Simpler example
Last Stress Time is the total
amount of stress time that will
have passed when the last stress
is completed

Keithley 4200-SCS Specifications

General

Brand	Keithley
Model	4200-SCS
Category	Semiconductors
Language	English