Keithley 4200-SCS - Page 125

4200-900-01 Rev. K / February 2017 Return to Section Topics 3-19
Model 4200-SCS User’s Manual Section 3: Common Device Characterization Tests
Figure 3-14
Advanced settings for terminal properties
A
B
DUT
Measure
ACI
Source
ACV
Source
DCV
Simplified Test Circuit:
+
-
+
-
+
-
+
-
Source
0 VDC
Configuration A (default)
Use the following settings to source AC drive voltage and DC bias voltage to terminal A and measure
AC current at terminal B:
A
B
DUT
Measure
ACI
Source
ACV
Source
DCV
Simplified Test Circuit:
+
-
+
-
+
-
+
-
Source
0 VDC
Configuration B
Use the following settings to source AC drive voltage to terminal B, source DC bias voltage to terminal
A, and measure AC current at terminal A:
A
B
DUT
Measure
ACI
Source
ACV
Source
DCV
Simplified Test Circuit:
+
-
+
-
+
-
+
-
Source
0 VDC
Configuration C
Use the following settings to source AC drive voltage to terminal A, source DC bias voltage to terminal
B, and measure AC current at terminal B:
A
B
DUT
Measure
ACI
Source
ACV
Source
DCV
Simplified Test Circuit:
+
-
+
-
+
-
+
-
Source
0 VDC
Configuration D
Use the following settings to source AC drive voltage and DC bias voltage to terminal B, and measure
AC current at terminal A: