Keithley 4200-SCS User Manual

3-88 Return to Section Topics 4200-900-01 Rev. K / February 2017
Section 3: Common Device Characterization Tests Model 4200-SCS User’s Manual
1.Select Enable Cycles.
2. Select the Segment Stress / Measure Mode.
3. Select and configure Stress / Measure Cycle Times:
If needed, specify a Stress / Measure Delay. This allows the device to settle after stressing
before performing the DC measurements.
4. Periodic testing is not available for the Segment Stress / Measure Mode.
5. Clicking the Apply button updates the settings in the Subsite Setup tab. The button will be
inactive if updating is not required.
6. Click Device Stress Properties to open the window to configure the Segment ARB
®
waveform, SMU bias levels and matrix connections (see Figure 3-71). Proceed to Configure
Device Stress Properties on page 3-89 to continue the configuration process.
Figure 3-70
Segment stress / measure mode: Log and list cycle counts
Linear cycle counts:
After setting the first and total stress counts, and the number of
stresses, the linear Stress Counts will be automatically
calculated and displayed when Apply is clicked (Step 5). The
Number of Stresses must be less than the Total Stress Count, or
an error will be displayed. Note that the Total Stress Count is
cumulative.
Log cycle counts:
After setting the first and total stress counts, and the number of
stresses per decade, the log Stress Counts is automatically
calculated and displayed when Apply is clicked (step 5) (see
Figure 3-70). Note that the Total Stress Count is cumulative.
List cycle counts:
Cycle counts are added to the Cycle Times list by entering a
count value into the Stress Counts field and clicking Add. A
cycle count value can be removed by selecting it and clicking
Remove (see Figure 3-70). Note that the Total Stress Count is
cumulative.
Log cycle
List cycle

Keithley 4200-SCS Specifications

General

Brand	Keithley
Model	4200-SCS
Category	Semiconductors
Language	English