4200-900-01 Rev. K / February 2017 Return to Section Topics 3-131
Model 4200-SCS User’s Manual Section 3: Common Device Characterization Tests
Figure 3-109
Flash-Switch project
ConPin-Pulse or ConPin-DC test – This test is used to connect pulse or SMUs
to the DUT. Figure 3-110 shows the definition tab for ConPin-Pulse. The
parameters are typed into the UTM parameter table, with the Pin1, Pin2, and so
on determining where the instrument (SMU, VPU) signals connect. It is also
possible to configure a single switch matrix card using the GUI. Click the GUI
button shown in Figure 3-110 to see the dialog in Figure 3-111.
To Next Page
Loading...