3-150 Return to Section Topics 4200-900-01 Rev. K / February 2017
Section 3: Common Device Characterization Tests Model 4200-SCS User’s Manual
The Segment ARB waveform files (Flash-NAND-Vg.ksf and Flash-NAND-Vd.ksf)
used for stressing are loaded into the device stress properties window shown in
Figure 3-123. The stress properties window is opened by clicking the Device
Stress Properties button in Figure 3-122.
Figure 3-122
FlashDisturb-NAND project – subsite setup tab
Figure 3-123
FlashDisturb-NAND project – device stress properties
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