Keithley 4200-SCS User Manual

4200-900-01 Rev. K / February 2017 Return to Section Topics 3-15
Model 4200-SCS User’s Manual Section 3: Common Device Characterization Tests
Mode
There are two test modes for the 4210-CVU: sweeping and sampling. The
sweeping test mode applies to any ITM in which voltage or frequency varies with
time. The sampling test mode applies to any ITM in which the forced voltage and
frequency are static, with measurements made at timed intervals.
With the Sweeping Mode selected (Figure 3-11A), the sweep delay and hold time
can be set. With the Sampling Mode selected (Figure 3-11B), the Interval,
#samples, and hold time can be set. The setting ranges for these timing
parameters are as follows:
• For the sweeping mode, Sweep Delay and Hold Time can be set from 0 to 999s.
Use the drop-down menu to select units (µs, ms, or s).
• For the sampling mode, Interval and Hold Time can be set from 0 to 999s. Use list
to select units (µs, ms, or s). The # Samples (measurements) can be set from 1 to
4096.
The CVU ITM examples provide details about the mode parameters.
NOTE The test mode (sweeping or sampling) can also be selected from the Mode drop-
down menu located at the top of the definition tab (Figure 3-10).
Timestamp and output disable
At the bottom of the ITM Timing window are controls for the timestamp and output
disable:
•With Timestamp enabled (checked), a timestamp for every measurement will be
included in the Sheet tab.
•With Disable outputs at completion enabled (checked), the output will turn off (0
V) when the test is completed. When disabled, DC Bias voltage will remain at the
last bias voltage level.

Keithley 4200-SCS Specifications

General

Brand	Keithley
Model	4200-SCS
Category	Semiconductors
Language	English