Keithley 4200-SCS - Page 143

4200-900-01 Rev. K / February 2017 Return to Section Topics 3-37
Model 4200-SCS User’s Manual Section 3: Common Device Characterization Tests
Figure 3-33
Pulse IV connections using RF G-S-G probes
Figure 3-34
Pulse IV connections using the 8101-PIV test fixture