4200-900-01 Rev. K / February 2017 Return to Section Topics 3-83
Model 4200-SCS User’s Manual Section 3: Common Device Characterization Tests
For example, if you have set the terminals to the settings in the following table, on
stress, source is powered on first, gate second, drain third, and bulk fourth. Power
off for the stress is in the order drain, gate, source and bulk.
Degradation targets
Tests and Output Values for the device are listed in this area of the properties
window. Post-stress Output Value readings are compared to the first cycle pre-
stress readings. The % Change between the pre-stress and post-stress readings
are listed in Subsite Data sheet.
An Output Value can be enabled (checked) as a Target and assigned a Target
Value (in % or an absolute value). When all Targets for a device are reached, that
device will not be tested for subsequent cycles. The Subsite Plan will stop when
all enabled targets are reached or the last subsite cycle is completed.
Stress measurements
Stress measurements can be performed for each device. When the device is
being stressed by DC voltage, the DC currents can be measured. If the device is
being stressed by DC current, the DC voltages can be measured. Stress
measurements are placed in the Subsite Data sheet for the Stress label.
When a device is being stressed by AC voltage (VPU), the current or voltage
cannot be measured by the VPU. The VPU does not have measure capability.
Figure 3-66 shows an example of a single First Stress Only measurement for I
Drain. If Every Stress Cycle was selected, then there would be a corresponding
reading for every stress cycle.
Table 3-27
SMU power order
On Off
Drain
31
Gate
22
Source
13
Bulk
44
To Next Page
Loading...
Need help?
General