Keithley 4200-SCS User Manual

4200-900-01 Rev. K / February 2017 Return to Section Topics 3-93
Model 4200-SCS User’s Manual Section 3: Common Device Characterization Tests
% Change = ABS[(Post-Stress Rdg: Pre-Stress Rdg) / Pre-Stress Rdg x
100]
For the example in Figure 3-74, the following shows how % Change IDOFF
for Cycle 2 is calculated:
% Change IDOFF= ABS[(82.2013e-15: 291.1666e-15)/291.1666e-15 x
100]
= ABS[-208.9653e-15 / 291.1666e-15 x 100]
= ABS[-0.7176 x 100]
= 71.8
Column EThis is the Target Value that was assigned to the Output Value in the
Device Stress Properties window (see step 4 in Figure 3-59). A
Target Value of 0.0 indicates that the Target for IDDOF is disabled.
A Target is reached when the % Change value equals or exceeds
the Target Value.
Starting with Column F, every three columns provide readings for another Output
Value, the % Change and the Target Value.

Keithley 4200-SCS Specifications

General

Brand	Keithley
Model	4200-SCS
Category	Semiconductors
Language	English