4200-900-01 Rev. K / February 2017 Return to Section Topics 3-141
Model 4200-SCS User’s Manual Section 3: Common Device Characterization Tests
Figure 3-115
FlashEndurance-NAND project – Subsite Graph tab
Program test – The Definition tab for this test is shown in Figure 3-116. This test
uses a partially predefined Segment ARB
®
waveforms, see Figure 3-102, to
program a flash memory device and identical to the Program UTMs included in
the other Flash projects.
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