Keithley 4200-SCS User Manual

3-142 Return to Section Topics 4200-900-01 Rev. K / February 2017
Section 3: Common Device Characterization Tests Model 4200-SCS User’s Manual
Figure 3-116
FlashEndurance-NAND project – Program Definition tab
SetupDC-Program test – The Definition tab for this test is shown in Figure 3-117.
This test isolates the VPU outputs from the DUT. It does this by opening the
HEOR for each VPU channel. Disconnecting the VPU channels allows for
accurate DC results.
The SetupDC test is a UTM that should be used when using a directly wired DUT,
without an external switch matrix. SetupDC disconnects the PG2 channels from
the DUT to permit proper operation of any subsequent DC measurements.
When using a switch matrix, a ConPin test is used (see the Reference manual,
LPT functions, page 8-91) to set the appropriate matrix connections prior to any
DC tests.

Keithley 4200-SCS Specifications

General

Brand	Keithley
Model	4200-SCS
Category	Semiconductors
Language	English