Keithley 4200-SCS User Manual

4200-900-01 Rev. K / February 2017 Return to Section Topics 3-143
Model 4200-SCS User’s Manual Section 3: Common Device Characterization Tests
Figure 3-117
FlashEndurance-NAND project – SetupDC Definition tab
Vt-MaxGm-Program test – This test is used to perform a DC voltage sweep on
the gate of the DUT and measure the drain current at each sweep step. The
default Definition tab for this test is shown in Figure 3-118. SMU3 is configured to
perform a 101 point sweep from 0 to 5 V in 50 mV steps.
SMU1 is configured to DC bias the drain at 0.5 V and measure current at each
step of the sweep. The results of the test are shown in the Graph tab (see Figure
3-119). The Vt-MaxGm tests may be replaced with another Vt or DC test. Or,
additional DC tests may be added after this test.

Keithley 4200-SCS Specifications

General

Brand	Keithley
Model	4200-SCS
Category	Semiconductors
Language	English