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4200-900-01 Rev. K / February 2017 Return to Section Topics 3-159
Model 4200-SCS User’s Manual Section 3: Common Device Characterization Tests
Figure 3-128
Single slow pulse example data plot
0.0
0
50
100
150
200
250
300
350
400
450
1nm Chem Ox/3.5 nm HfSi
x
O
y
nFET W/L = 10/1
mm
V
d
= 40mV
PW
Drain Current [
m
A]
Gate Voltage [V]
1.00.5 1.5 2.0
V
g
= -1 to 2.2 V
PW = 10
m
S
t
r
, t
f
= 5
m
S
t
r
t
f
t
r
t
f

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