PerkinElmer LabChip GX - Description of Diagnostic Tests

Troubleshooting and Diagnostics 292
V4.2 LabChip GX User Manual PerkinElmer
Description of Diagnostic Tests
This section includes the following information about the diagnostic
tests: the test names, descriptions, potential failures, and the chip
required to run the test.
• “Computer Resources Test” on page 292
• “System Components Test” on page 293
• “Chip Interface Test” on page 293
• “RF Tag Test” on page 294
• “Pressure Leak Test” on page 294
• “Chip Temperature Test” on page 294
• “Current Leakage Test” on page 295
• “Optics Test” on page 295
• “Plate Handler Test” on page 296
• “HV Voltage Calibration Test” on page 297
• “HV Current Calibration Test” on page 297
• “Barcode Test” on page 297
Computer Resources Test
Any chip can be loaded
Description Potential Cause of Failure
Check CFR database
connection (only if
Security is installed)
SQL server not started. Start SQL Server
Express.
Database not installed properly. Contact
PerkinElmer Technical Support (see
page 3).
Check CDR Service
(only if Security is
installed)
Service exited unexpectedly or not
started.
Check Remote CDR
Connection (only if
Remote CDR is set
up.)
Remote server is down. Network is down.
Memory Check Available memory below 500 MB. System
may function with lower memory but
there is risk of failure if analyzing many
plates.