Keithley 4200-SCS - Page 331

4200-900-01 Rev. K / February 2017 Index-3
Index Model 4200-SCS User’s Manual
configuring for each device terminal 2-18
KITE interface overview
....................................... 2-4
KITE ITM configuration
....................................... 3-13
KITE Library management
................................. 2-45
KITE project folders
............................................ 2-29
KITE project structure
........................................... 2-3
KPulse
Custom File Arb waveforms (Full-Arb)
......... 5-8
Segment ARB waveforms
............................ 5-6
Setup and help
............................................. 5-3
Standard Pulse waveforms
.......................... 5-4
Starting KPulse
............................................ 5-2
Triggering
..................................................... 5-3
Waveform types
......................................... 5-12
L
LAN connections .................................................. 1-9
Leveraging the Default Project
........................... 3-10
Line power receptacle
.......................................... 1-6
Line-item descriptions for a .kdv file
................... 2-28
Locate and Run the “vds-id” test module
........... 1-40
M
Measure settings ................................................ 3-17
Model 4200-CVU card
........................................ 1-16
Force-measure timing
................................ 1-20
Measurement circuit
................................... 1-17
Measurement functions
.............................. 1-17
Measurement overview
.............................. 1-16
Model 4200-PA
connectors
.................................................. 1-15
Model 8101- PIV test fixture
............................... 3-32
Model 8101-PIV test fixture
................................ 3-33
Models 4200-SMU and 4210-SMU
connectors
.................................................. 1-12
Modified project plan settings
............................. 4-22
N
NBTI (negative bias temperature instability) ...... 3-78
NBTI process flow
.............................................. 3-99
New Project menu selection
............................... 4-39
O
Open KITE .......................................................... 1-38
Open KITE and the “ivswitch” project
................. 4-11
P
PGU initialization ................................................ 4-33
PGU stress pulse specifications
......................... 4-34
pgu-trigger test - trigger the burst of stress pulses
....
4-34
PIV-A test connections
....................................... 3-30
Power Divider
...........................................1-26, 1-27
Powering up the 4200-SCS
.................................. 1-5
prbgen user modules
.......................................... 4-17
Primary differences between an ITM and a UTM
.2-8
Printer connections
............................................... 1-9
Probe station connections
.................................... 1-8
prober-init
........................................................... 4-23
prober-prompt test and dialog window
............... 4-25
prober-separate
.................................................. 4-25
Programming and erasing flash memory
......... 3-100
Project Navigator - “ivpgswitch” project
.............. 4-31
Project Navigator - “ivswitch” project
................. 4-11
Project Navigator - probesubsites project
.......... 4-21
Project Navigator Checkboxes
........................... 2-21
Pulse generator card
.......................................... 1-20
Pulse generator configuration
............................ 4-29
Pulse IV for CMOS
Model 4200-PIV-A
..................................... 3-29
Pulse Mode (SMUs)
........................................... 2-16
Pulse projects
Power Divider
.................................. 1-26, 1-27
RBT
.................................................. 1-26, 1-27
Pulse source-measure
Full-Arb (FARB)
......................................... 1-24
KPulse
............................................... 1-25
Pulse generator settings
............................ 1-25
Scope card settings
................................... 1-29
Standard Pulse
.......................................... 1-22
Pulse source-measure UTMs
PulseIVulib
................................................. 3-49
cal_pulseiv
......................................... 3-50
scopeshot_pulseiv
................... 3-63, 3-64
scopeshot_cal_pulseiv
................... 3-63
scopeshot_pulseiv_demo
.................. 3-66
Vdid_Pulse_DC_Family_pulseiv
........ 3-53
vdsid_pulseiv
..................................... 3-51
vdsid_pulseiv_demo
.......................... 3-66
Vgid_DC_Pulse_pulseiv
.................... 3-59
vgsid_pulseiv
..................................... 3-57
vgsid_pulseiv_demo
.......................... 3-66
R
RBT .......................................................... 1-26, 1-27
Remote Bias Tee (RBT) and 3-port Power Divider
....
1-26
Run “vds-id” test
................................................. 1-42
Running the test
................................................. 2-23
S
Sample wafer organization ................................ 4-16
Save the system configuration
........................... 4-11
Saving the system configuration
.... 4-20, 4-31, 4-39
SCP2 (Oscilloscope)
.......................................... 1-28
Second “connect” test - connects the device to the
PGU
........................................................... 4-33
Segment Arb
...................................................... 1-23
Segment Stress/Measure Mode
........................ 3-85
Selected device and destination folder
.............. 2-47
Selected ITM and destination folder
.................. 2-50
Selecting a test
.................................................. 2-23
Setting the AC drive conditions
.......................... 3-17
Setting the DC bias conditions
........................... 3-17
Setting the Model 590 GPIB address
................. 4-39
Signal paths for “2-wireresistor” tests
................ 4-13
Signal paths for “3terminal-npn-bjt” tests
........... 4-12
Signal paths for “4terminal-n-fet” tests
............... 4-12
Signal paths for “capacitor” test
......................... 4-13
Signal paths for “diode” tests
............................. 4-13
Signal paths for the pre and post stress tests
.... 4-32
Signal paths to apply the pulse stress
............... 4-33
SMU terminals and connectors
.......................... 1-12
Source-Measure Hardware
Ground unit (GNDU) overview
Basic characteristics
.......................... 1-32
Basic circuit configurations
................ 1-32