Index-4 4200-900-01 Rev. K / February 2017
Model 4200-SCS User’s Manual Index
Ground unit connections .................1-32
Ground unit DUT connections
.........1-33
Ground unit terminals and connectors
1-34
Chassis ground
...............................1-35
COMMON terminal
.........................1-35
FORCE terminal
.............................. 1-34
SENSE terminal
..............................1-35
Models 4200-SMU and 4210-SMU overview
....
1-10
Basic SMU circuit configuration
..........1-10
SMU terminals and connectors
FORCE terminal
.................................1-12
PA CNTRL connector
.........................1-13
SENSE LO terminal
............................1-13
SENSE terminal
.................................1-13
SMU with Model 4200-PA overview
...........1-13
PreAmp terminals and connectors
.....1-14
FORCE terminal
.............................. 1-15
PreAmp CONTROL connector
........1-16
SENSE terminal
..............................1-16
Status
.................................................................3-20
Stressing
Segment Stress/Measure Mode
.................3-85
Submit device dialog box
....................................2-47
Submit test dialog box
........................................2-50
Submitting devices, ITMs, and UTMs to libraries
......
2-45
Subsite Cycling
Segment Stress/Measure Mode
.................3-85
Subsite cycling
Configuration
..............................................3-69
Configuration sequence
............................. 3-98
Cycle Mode
Subsite Data sheet
.............................3-92
Subsite Graph
....................................3-97
Device connections
.................................... 3-68
Mode selection
........................................... 3-70
Running cycle subsite
................................ 3-91
Segment Stress/Measure Mode configuration
..
3-87
Stress/Measure Mode
Configuring device stress properties
..3-74
Subsite Data sheet
.............................3-94
Subsite Graph
....................................3-98
Subsite Setup tab
.......................................3-69
Timing setup
.....................................3-71, 3-72
Subsite Data sheet
Cycle Mode
................................................3-92
Stress/Measure Mode
......................3-92, 3-94
Subsite Graph tab
Cycle Mode
................................................3-97
Stress/Measure Mode
................................ 3-98
Subsite Plan
.......................................................2-22
Subsite Plan containing the Device Plan to be
submitted
....................................................2-45
Subsite Plan window containing the Device Plan to be
submitted
....................................................2-46
Subsite Settings window
Cycle Mode
................................................3-95
Stress/Measure Mode
................................ 3-96
Subsite Setup tab
...............................................3-69
Supplied
..............................................................3-31
Supplied interconnect parts
................................3-30
Supported external equipment table
.................... 4-4
Supported probers
............................................. 4-17
Sweep mode (triggering)
.................................... 1-30
System configuration for the “probesubsites” project
4-18
System configuration with external instruments
... 4-3
System Connections
............................................ 1-6
System connections
Connecting a LAN
........................................ 1-9
Connecting a printer
..................................... 1-9
Connecting a prober
.................................... 1-8
Connecting GPIB instruments
...................... 1-7
Connecting the keyboard and mouse (optional)
1-6
T
Target applications and test projects for PIV-Q .3-29
TDDB (time dependent dielectric breakdown
..... 3-78
Test conditions
................................................... 3-18
Test definition
..................................................... 1-41
Test library
access selection
......................................... 2-30
results folder
.............................................. 2-31
Test sequence
................................................... 4-26
Test sequence for “ivpgswitch” project
............... 4-35
Test system for “ivpgswitch” project
................... 4-28
Testing with less than ±20 volts
......................... 1-36
Testing with more than ±20 volts
....................... 1-37
Tests (ITMs and UTMs)
..................................... 2-22
Three terminal NPN BJT tests
............................. 3-6
Two wire resistor test
........................................... 3-7
Typical
test fixture
.................................................. 1-36
Typical CV curve
................................................ 4-37
U
Unconfigured Graph Definition window for the “vds-id”
ITM
............................................................. 2-44
Unconfigured Graph Definition window for the vds-id
ITM
............................................................. 2-42
Unconfigured UTM message
............................. 2-48
Understanding Append worksheets
................... 2-36
Understanding KITE
............................................. 2-3
Understanding the Formula combo box of the Data
worksheet
................................................... 2-34
Unpacking and inspection
Inspection for damage
................................. 1-3
Manuals
....................................................... 1-3
Repacking for shipment
............................... 1-3
Shipment contents
....................................... 1-3
Unpacking the 4200-SCS
..................................... 1-3
Usrlib subdirectory
............................................. 2-31
UTM (User Test Modules)
Definition tab
.................................... 2-11, 2-12
V
Vds-id
graph after configuring its Graph Definition
window
................................................... 2-44
View and Save the Graph Data
.......................... 1-43
View and save the Sheet data
........................... 1-42
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