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Hioki IM3570 - Page 402

Hioki IM3570
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13.1 General Specifications
394
9699
SMD Test Fixture
This fixture is for the bot-
tom surface of electrodes.
Measurable range: DC to 120 MHz
Maximum applied voltage: DC±40 V
Test sample dimensions: Test sample width of 1 to 4 mm
Test sample height of 1.5 mm or less
IM9000
Equivalent Circuit Analysis Firmware
This option enables equiva-
lent circuit analysis and oth-
er IM3570 functionality.
Equivalent circuit analysis (automatic, fixed): 5 patterns
PASS/FAIL judgments for equivalent circuit elements
Analysis result simulation
Cole-cole plot display/admittance circle display
IM9100
SMD Test Fixture
Measurable range: DC to 8 MHz
Maximum applied voltage:
±42 Vpeak (AC+DC)
Maximum applied current:
±0.15 A rms (±0.15 ADC)
Measurement test sample dimensions: 0.4×0.2 mm,0.6×0.3 mm,
1.0×0.5 mm
9269-10
DC Bias Voltage Unit
Measurable range: 40 Hz to 2 MHz
Maximum applied current: DC2 A
9268-10
DC Bias Voltage Unit
Measurable range: 40 Hz to 5 MHz
Maximum applied voltage: DC
±40 V

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