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Hioki IM3570 - Page 401

Hioki IM3570
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13.1 General Specifications
393
13
Chapter 13 Specifications
Options
L2000
4-terminal Probe
Alligator-clip-type measure-
ment probes.
These general-purpose dual-
electrode clips fit a wide range
of conductor thicknesses.
9262
Test Fixture
Measurable range: DC to 8 MHz
Maximum voltage: ±42 Vpeak (AC+DC)
Maximum current: ±1 Apeak (AC+DC)
Measurement terminal hole diameter: 5 mm or less
Measurable range: DC to 8 MHz
Maximum applied voltage: DC±40 V
Test sample dimensions: Lead diameter of 2 mm or less
Lead pitch of 5 mm or more
This fixture is for measuring
lead components. (less than
10 m residual resistance
after zero adjustment)
9140-10
4-terminal Probe
Measurable range: DC to 200 kHz
Maximum voltage: ±42 Vpeak (AC+DC)
Maximum current: ±1 Apeak (AC+DC)Measure-
ment terminal hole diameter:
0.3 mm to 5 mm
L2001
Pincher Probe
Measurable range: DC to 8 MHz
Maximum applied voltage: ±42 Vpeak(AC+DC)
Maximum applied current: ±1 Apeak(AC+DC)
Electrode tip spacing: 0.3 to approx. 6 mm
9261-10
4-terminal Probe
Measurable range: DC to 8 MHz
Maximum voltage: ±42 Vpeak (AC+DC)
Maximum current: ±1 Apeak (AC+DC)
Measurement terminal hole diameter: 0.3 mm to 5 mm
9500-10
4-terminal Probe
Measurable range: DC to 200 kHz
Maximum voltage: ±42 Vpeak (AC+DC)
Maximum current: ±1 Apeak (AC+DC)
Measurement terminal hole diameter:
0.3 mm to 2.0 mm
9263
SMD Test Fixture
This fixture is for measuring chip
components. (less than 10 m
residual resistance after zero ad-
justment)
Measurable range: DC to 8 MHz
Maximum applied voltage: DC±40 V
Test sample dimensions: Test sample width of 1 to 10 mm
9677
SMD Test Fixture
Measurable range: DC to 120 MHz
Maximum applied voltage: DC±40 V
Test sample width of 3.5±0.5 mm or less
IM9901: 0603 to 2220 (EIA)
IM9902: 0201 to 2220 (EIA)

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