Configuring the Internal Baseband Source
R&S
®
SMW200A
307User Manual 1175.6632.02 ─ 30
Create Test Signal
Opens the dialog with further setting for the selected Test Signal Form, see:
●
Chapter 5.7.3.2, "Sine Test Signals", on page 307
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Chapter 5.7.3.3, "Rectangular Test Signal", on page 308
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Chapter 5.7.3.4, "Constant IQ Test Signal", on page 310
●
Chapter 5.8.4, "AWGN Test Signal", on page 349
Generation of test signals is possible in configurations with separated baseband sour-
ces ("System Configuration > Fading/Baseband Config > BB Source Configuration >
Separated").
5.7.3.2 Sine Test Signals
Access:
► Select "Baseband > ARB > General > Test Signal Form > Sine" and press "Create
Test Signal".
This dialog provides settings for configuration of a sinusoidal test signal. A sine
wave is generated on the I path, and a sine wave of the same frequency but
phase-shifted is generated on the Q path. For more information, refer to Chap-
ter 5.7.2.2, "ARB Test Signals", on page 298.
The dialog displays the characteristic of the currently selected signal.
Settings:
Frequency................................................................................................................... 307
Samples per Period.....................................................................................................308
Phase Offset Q............................................................................................................308
Generate Signal File................................................................................................... 308
Generate Signal RAM................................................................................................. 308
Frequency
Enters the frequency of the test signal.
Using the Arbitrary Waveform Generator (ARB)