Power analysis (option R&S RTM-K31)
R&S
®
RTM3000
373User Manual 1335.9090.02 ─ 09
Remote command:
POWer:MODulation:TYPE on page 731
POWer:MODulation:THReshold[:UPPer] on page 732
POWer:MODulation:THReshold:LOWer on page 732
POWer:MODulation:THReshold:HYSTeresis on page 732
14.6.3 Dynamic on resistance
The dynamic On resistance analysis measures the resistance of a switching device,
during operation. Because voltage and current may vary in time, the resistance is not
constant, thus it is called dynamic On resistance. It is defined as the ratio dV/dI.
14.6.3.1 Dynamic on resistance results
The results of " Dynamic On Resistance" measurements are:
●
the voltage waveform
●
the current waveform
●
the dynamic on resistance value
Remote commands are described in Chapter 17.12.5, "Dynamic ON resistance",
on page 720.
14.6.3.2 Configuring dynamic on resistance measurements
For details of the configuration settings, see Chapter 14.6.3.3, "Dynamic on resistance
settings", on page 374.
1. Press the Apps Selection key. Tap "Power Analysis".
2. In the "Switching" tab, tap "Dynamic On Res.".
3. Connect the differential voltage probe and the current probe to the oscilloscope.
It is recommended that you use a high-voltage differential probe for measurements
at the DUT power input.
4. Demagnetize the current probe. For details, see the user manual of your current
probe.
5. Select the "Tools" tab.
6. Connect the probes to the R&S RT-ZF20 power deskew fixture.
7. "Deskew" the probes and adjust the "Zero Offset".
8. Disconnect the probes from the R&S RT-ZF20 power deskew fixture.
9. Connect the probes to the DUT:
● Connect the positive (+) signal socket of the differential probe to the drain of
the transistor.
Switching power measurements
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