Multiple SMU connections
Connections to LO on the 2600B are not necessarily at 0 V. Hazardous voltages could exist
between LO and chassis ground. Make sure that high-voltage precautions are taken
throughout the test system. Alternatively, limit hazardous levels by adding external
protection to limit the voltage between LO and chassis. Failure to make sure high-voltage
precautions are used throughout the test system or a failure to limit hazardous levels could
result in severe personal injury or death from electric shock.
Carefully consider and configure the appropriate output-off state, source function, and
compliance limits before connecting the 2600B to a device that can deliver energy (for
example, other voltage sources, batteries, capacitors, solar cells, or other 2600B
instruments). Configure recommended instrument settings before making connections to the
device. Failure to consider the output-off state, source, and compliance limits may result in
damage to the instrument or to the device under test (DUT).
The following figures show how to use the SMUs of two 2600B instruments to test a 3-terminal device,
such as an N-channel JFET. A typical application is for the 2600B to source a range of gate voltages,
while another 2600B sources voltage to the drain of the device and measures current at each
gate voltage.
To Next Page
Loading...
Need help?
General
