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Lucent Technologies FT-2000 OC-48 - Page 1491

Lucent Technologies FT-2000 OC-48
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365-575-102 DetailedLevelProcedure:
Issue 8.0, July 2002 Page 1 of 4
DLP-541
Test DRI Cross-Connections for Path Integrity in
FT-2000 Ring
Overview: This procedure is used to test path integrity through the DRI
cross-connections of an FT-2000 ring (Figures 1 and 2) using external test sets.
1. Required Test Equipment:
Craft Interface Terminal (CIT)
Wrist Strap
Microwave Logic's ST-112 SONETest Transmission Analyzer
or equivalent
!
WARNING:
Unterminated optical connectors may emit invisible laser radiation. Eye
damage may occur if beam is viewed directly or with improper optical
instruments. Avoid direct exposure to beam.
!
CAUTION:
Use a static ground wrist strap whenever handling circuit packs or
working on an FT-2000 add/drop-rings terminal to prevent electrostatic
discharge damage to sensitive components. See "Electrostatic
Discharge (ESD) Considerations" in Trouble Clearing: TAD-100.
Referring to Figure 1 and Figure 2, which figure most closely represents your
configuration?
If Figure 1, then continue with Step 2.
If Figure 2, then continue with Step 12.
NOTE:
Assistance is required at the source and destination test sets.
NOTE:
Path testing should be accomplished by using an end-to-end
arrangement as shown in Figure 3. However, due to equipment
availability, another possibility includes a loopback arrangement
(Figure 4).

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