DLP-503: Detailed Level Procedure 365-575-102
Page 10 of 10 Issue 8.0, July 2002
Figure 5 – Example of Test Auto Turnup Report - Cross-Connect Wir-
ing Test (Slots 1A-2B Equipped with OC3 Circuit Packs and Remaining
Slots Equipped with DS3/STS1E Circuit Packs)
NODE-0 97-11-17 08:30:45 EST
M Test-Auto Turnup:DSX:ALL: COMPLD
/* Test Auto Turnup Report - Cross-Connect Wiring Test
=============================================================
Line 1: ------------LS INTFC------------
1122334455667788
port ABABABABABABABAB
1 gggggFggFggggggg
2 gFgg-ggggggg
3 gFgg-ggggggg
*/
;