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Inspect the SPM system hardware for any signs of damage during packaging or transport.
Ensure the power supply configuration matches the available laboratory power for safe operation.
Establish Ethernet connections for communication between the R9 Controller and the workstation.
Launch and familiarize yourself with the R9 control system software interface and components.
Perform offline and online tests to verify the R9 controller's functionality before connecting the microscope.
Configure approach and feedback settings to ensure proper tip-sample interaction and system behavior.
Adjust feedback parameters to regulate the probe's position relative to the sample surface.
Utilize the Fast In procedure for rapid approach of the tip to the sample, monitoring via camera.
Employ the Slow Approach procedure to safely close remaining tip-sample separation with feedback checks.
Switch between different operating modes like NCAFM, Tapping, Contact AFM, and STM as needed.
Check the available signals for imaging and spectroscopy by examining toolbar icons and windows.
Set up scan parameters such as scan size, speed, and position within the Scan Area Window.
Adjust feedback modes and scanning parameters to achieve optimal image quality.
Implement automatic or manual drift correction to compensate for positional drift during image acquisition.
Configure the system to acquire both topographic and spectroscopic data at selected points, lines, or regions.
Utilize the Browser module to display, process, and analyze saved SPM images and data.
Apply image processing techniques like background removal and filtering to enhance data clarity.
Manipulate and view SPM images in 2D or 3D formats for better visualization and analysis.
Set up parameters for I/V ramp spectroscopy, controlling bias voltage sweep and data acquisition.
Perform dI/dV spectroscopy by measuring current changes relative to bias voltage modulation.
Understand the function and connection of Channel 1 and Channel 2 drive components in Hardware Space.
Configure Lock-in Amplifiers for various functions, including low pass filtering and dI/dV measurements.
Learn about the PI controllers (Z PI and Kelvin PI) used for feedback control in SPM systems.
Details the Scan Processor's role in controlling probe motion, scan parameters, and drift correction.
Configure High Voltage Amplifiers (HVAs) for controlling SPM system outputs and piezo elements.
Learn how to use Measure Items to enable data channels for viewing and saving in R9 software.
Explore various external hardware devices like preamplifiers and controllers that integrate with the R9 system.
Step-by-step guide for connecting the RHK UHV300/700 STM Beetle microscope to the R9 Controller.
Instructions for connecting the RHK UHV350/750 AFM/STM Beetle microscope to the R9 Controller.
Details on connecting the RHK UHV900 Pan STM microscope to the R9 Controller.
Pinout details for the R9 Preamp I/O 44-pin female connector, essential for signal connections.
Pinout information for the R9 High Voltage Output 10-pin connector used for scan head control.
Learn the basic steps and rules for building custom procedures in Procedure Space.
Understand how to connect components using virtual wires in Hardware and Procedure Spaces.
Ensure procedures function correctly by performing validation checks before execution.
Learn the methods for running procedures from Hardware Space or Procedure Panels.
Detailed reference for the Scan Area Window controls used for image acquisition setup.
Comprehensive guide to using XY Graph Windows for data visualization and analysis.
Information on using the Oscilloscope for viewing time-domain signals and diagnostics.
Guide to using the Spectrum Analyzer for noise analysis and frequency domain measurements.
New options for HV amplifiers, including auto-scaling voltage limits and physical unit display.
Ability to minimize dashboard panels to the ribbon bar to maximize screen space usage.
Improvements in spectroscopy routines, allowing bias modulation to be disabled during topographic scans.
Introduction of the Phase-Locked Loop feature for resonance frequency locking and control.
Tool for tracking laser intensity on PSD quadrants for AFM beam deflection feedback.
Feature enabling R9 control via text commands sent over Ethernet for applications like LabVIEW.
Introduction of both automatic and manual drift correction modes for image stabilization.
Allows users to customize channel names for improved clarity and easier data management.
Simplified DAC ramping to physical units, enabling more intuitive spectroscopy control.
New feature for performing spectroscopy at specific points with unique scan parameters during imaging.
Capability to monitor transients over long time scales, such as temperature, directly within R9 software.
General| Brand | RHK Technology |
|---|---|
| Model | R9 |
| Category | Control Systems |
| Language | English |
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