Using Test Screens
Gem-5 User’s Manual 195
TAB = Select Item: This key has the same effect as the right arrow key when
moving from one setting to another. In addition, the Shift+TAB key has the same
effect as the Left Arrow key (◄). This is most useful when leaving a (blue) edit
setting that uses the left and right arrow keys internally (◄, ►). Here also, the Enter
key accepts the current value and moves to the next line item.
+, - = Change Value: These keys are used to change the value of the selected line
item either by toggling through the available options (for example, “YES” or “NO”)
or by increasing/decreasing a numerical value.
CTRL +, CTRL - = Fast Change: Pressing these key combinations allows for a
rapid change of the value of the selected line item.
CTRL+E = Edit: Allows direct entry of a numerical value for selected item when the
input range is large.
PgDn, PgUp, (Ctrl +) Home and (Ctrl +) End: Select a different detection zone on
screens dealing with individual zones. The Home/CTRL + Home keys select Zone
#1/ first zone in the group while End/CTRL+End select the last zone in the
group/last zone on. On other screens, PgDn and PgUp are used to scroll through a list
of data that exceeds the number of lines on the screen. They are also used on
alternative screens, for example, to “Change…” a “…Source” or source “…Jig”, to
“Change…” a “…Voice” or to “Change…” a “…Current Weight”.
Esc = Return to Previous Menu: Pressing the Esc key saves the current values and
displays the previous menu. If any change was made on the screen, the event is
recorded in the Service Data Log on page 189, if enabled.
Depending on the model, one, some, or all of the following menu items will be
required (all starting from the main Service Menu; shown in order of appearance
unless already discussed in a previous chapter):
1. F2 – Test Menu (see Figure 39 on page 73):
a. F1 – Rate Meter
b. F2 – HVPS Meter
c. F3 – Counter Test
d. F4 – Amplifier Pulse Test
e. F6 – Sensor Board Tests
f. F7 – Timer Tests
g. F10 – Detector Board ID
h. F11 – Carrier Board Tests
i. F12 – Background Trend Graph
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