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Mitutoyo SURFTEST SJ-410 - Page 557

Mitutoyo SURFTEST SJ-410
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23. REFERENCE INFORMATION
No. 99MBB765A
23-7
■ Motif
Normally, when wave segments are removed from an evaluation profile, the evaluation
profile becomes distorted. The motif method is designed to remove waviness without
causing distortion.
With this method, an evaluation profile is divided into units called “motifs”, which are based
on the wavelength of a component to be removed, and parameters to evaluate the profile
are calculated from each motif.
Parameters calculated from the motif analysis
■ DIN4776 profile
For measured surfaces that have deep valleys relative to the irregularity of the surface, the
position of a mean line that is calculated with these deep valleys will be inappropriate for
evaluating the true roughness of the surface. However, with this procedure, those negative
effects can be avoided to a certain extent. The procedure is shown below.
1. The initial mean line is obtained with respect to the input data.
Initial mean line
R1
AR1
Measured
profile
Ri
Ri+1
ARj
R
2Nmr
AR
Nmr
Evaluation length

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