Mitutoyo SURFTEST SJ-410 - Modifying the Sampling Length (L);Cut-Off Length (Λs) of the Unfiltered Profile P

Evaluation Profile Setup screen
2 Touch an evaluation profile to use, and touch .
Evaluating Condition Menu screen
¾ The selected evaluation profile is displayed on the Evaluating
Condition Menu screen.
7.3.2.2 Modifying the sampling length (L)/cut-off length (λs) of the unfiltered
profile P
When the unfiltered profile (P) is selected, the sampling length (L) and the cut-off length
(λs) are displayed on the Evaluating Condition Setup screen as evaluation-related variable
parameters. Change sampling lengths (L) and cut-off length (λs) if required.
■ Relationship between sampling lengths (L) and cut-off length (λs)
When a sampling length (L) is set, a cut-off length (λs) is set to one of the values as shown
below.
The symbol used to represent measurement sampling length changes according to the set
roughness standard. When the roughness standards “JIS2001”, “ISO1997”, “VDA”, or
“Free” are selected, “ℓp” is displayed. When the roughness standard “JIS1982” is selected,
“ℓ” is displayed.
Measurement
sampling length (L)
Cut-off length (λs)
0.08 mm (0.003 in)
2.5 μm, 8 μm, 25 μm, (98.425 μin, 314.960 μin, 984.251 μin), (NONE）
0.25 mm (0.009 in)
2.5 μm, 8 μm, 25 μm, (98.425 μin, 314.960 μin, 984.251 μin), (NONE）
0.8 mm (0.031 in)
2.5 μm, 8 μm, 25 μm, (98.425 μin, 314.960 μin, 984.251 μin), (NONE）
2.5 mm (0.098 in)
2.5 μm, 8 μm, 25 μm, (98.425 μin, 314.960 μin, 984.251 μin), (NONE）
8 mm (0.314 in)
2.5 μm, 8 μm, 25 μm, (98.425 μin, 314.960 μin, 984.251 μin), (NONE）
25 mm (984.251 in)
2.5 μm, 8 μm, 25 μm, (98.425 μin, 314.960 μin, 984.251 μin), (NONE）
No. 99MBB765A
7-8