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Keysight M9421A - Page 556

Keysight M9421A
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3 WLAN Mode
3.4 SEM Measurement
Before UE, the LTE-Advanced FDD/TDD standards gave the test specification
requirements for BS intra-band contiguous aggregation and intra-band non-
contiguous aggregation modes. However, for UE, only the requirements of intra-
band contiguous aggregation modes are defined. So, the standards don’t support
making the measurement in UE intra-band non-contiguous aggregation mode for
LTE-Advanced FDD/TDD. As a result, the preset values of Inner Offset/Limits are
temporarily set as those of Outer Offset/Limits for UE.
Limits for Inner Offsets
Since inner offsets are defined from the sub-block edges to the gap, limits from two
sub-blocks overlap each other. Therefore, the limit used for inner offsets are the
cumulative sum of limits from both sub-blocks. Offsets can have different RBWs,
which must be compensated when accumulated.
For example, when offset A and D overlap, the limit of offset A is calculated as
follows.
Th
e diagram below depicts what inner offset limits look like.
WLAN Mode User's &Programmer's Reference 556

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