Rohde & Schwarz SMBV100B - ARB Test Signals

Configuring the Internal Baseband Source
R&S
®
SMBV100B
147User Manual 1178.4460.02 ─ 03
GPIB). Usually, the waveform file is stored on one of the network drives which are
accessible for the operating system.
Related settings
See:
●
Chapter 3.6.3, "ARB Settings", on page 150
Related step-by-step decriptions
See:
●
Chapter 3.6.4, "How to Create, Generate and Play Waveform Files", on page 160
●
Chapter 3.6.4.6, "How to Define Periodically Repeating Traces", on page 172
●
Chapter 3.6.4.5, "How to Manually Create a Waveform Using Tag File Format",
on page 167
●
Chapter 3.6.4.7, "How to Create a Control List Using Tag File Format",
on page 173
●
Chapter 3.6.4.8, "How to Create a Data List Using Tag File Format", on page 175
●
Chapter 3.6.4.9, "Editing Waveform Files, Data and Control Lists", on page 176
3.6.2.2 ARB Test Signals
The following test signals are available:
●
Sine Test Signal: Two sinewave signals with a selectable (but equal) number of
samples per period and equal frequencies. When the generation is triggered, the
number of samples per period, together with the frequency of the test signal, deter-
mines the ARB clock frequency: "Clock Frequency" = "Frequency" * "Samples per
Period".
Note: Because the resulting clock rate must not exceed the maximum ARB clock
rate (see data sheet), the number of sample values is automatically restricted
depending on the selected frequency.
The first sine signal is mapped on the I samples, the second on the Q samples.
The two signals differ by a selectable phase offset. For a –90 deg offset, the result
is a unit vector in the I/Q plane, rotating counter-clockwise and starting at I = 0, Q =
–1. For a 0 deg offset, the I and Q samples are on the diagonal of a unit square (I(t)
= Q(t)).
Using the Arbitrary Waveform Generator (ARB)