5-128 Bus Interface
AMD-K5 Processor Technical Reference Manual 18524C/0—Nov1996
5.2.51 TDI (Test Data Input)
Input
Summary TDI carries input test data and instructions for testing on the
Test Access Port (TAP).
Sampled The processor samples TDI every rising TCK edge, but only
during the shift_IR and shift_DR states. TDI has an internal
pullup resistor.
TDI is always sampled, except while RESET or INIT is
asserted.
Details Instructions are shifted into the processor on TDI during the
shift_IR TAP state. Data are shifted into the processor on TDI
during the shift_DR TAP state.
See the IEEE Standard Test Access Port and Boundary-Scan
Architecture (IEEE 1149.1) specification for a description of
how the TAP signals and instructions are used for testing.
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