In this section:
Analog-to-digital converters...................................................... 7-1
Source-measure concepts ....................................................... 7-1
Measurement settling time considerations ............................. 7-26
Effects of load on current source settling time........................ 7-27
Creating pulses with the 2601B-PULSE SMU ........................ 7-28
Analog-to-digital converters
The 2601B-PULSE uses analog-to-digital converters (ADCs) in the SMU and pulser circuits.
The SMU circuit uses two integrating ADCs. The integrating ADCs use a ratiometric analog-to-digital
conversion technique. Depending on the configuration of the integrating ADCs, periodic fresh
reference measurements are required to minimize drift. The measurement aperture is used to
determine the time interval between these measurement updates. For additional information, see
Autozero (on page 4-41). To optimize operation of these ADCs, the instrument caches the reference
and zero values for the ten most recent power-line cycles. For additional information, see NPLC
caching (on page 4-42).
When the pulser is enabled, the 2601B-PULSE uses two high-speed analog-to-digital converters that
sample simultaneously. The measurement aperture determines how many individually sampled
results are averaged to produce the requested reading. These ADCs do not use the
autozero function.
Source-measure concepts
This section provides detailed information about source-measure concepts, including:
• Limit principles (on page 7-2)
• Power equations (on page 7-2)
• Reading limits for the 1 MS/s sample rate (on page 7-5)
• Operating boundaries (on page 7-6)
• Basic circuit configurations (on page 7-19)
• Guard (on page 7-24)
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