MPC5553/MPC5554 Microcontroller Reference Manual, Rev. 5
Freescale Semiconductor 24-1
Chapter 24
IEEE 1149.1 Test Access Port Controller (JTAGC)
24.1 Introduction
The JTAG port of the MPC5553/MPC5554 consists of four inputs and one output. These pins include
JTAG compliance select (JCOMP), test data input (TDI), test data output (TDO), test mode select (TMS),
and test clock input (TCK). TDI, TDO, TMS, and TCK are compliant with the IEEE 1149.1-2001 standard
and are shared with the NDI through the test access port (TAP) interface.