AMD Elan SC520 - Figure 25-5 Test Logic Operation: Data Scan

Boundary Scan Test Interface
Élan™SC520 Microcontroller User’s Manual 25-19
Figure 25-5 Test Logic Operation: Data Scan
JTAG_TCK
JTAG_TMS
Controller State
JTAG_TDI
Data Input to IR
IR Shift Register
Parallel Output of IR
Data Input to BSR
BSR Shift Register
Parallel Output of BSR
Register Selected
JTAG_TDO Enable
JTAG_TDO
Select-DR-Scan Run-Test/Idle Capture-DR
Shift-DR
Exit1-DR Pause-DR Exit2-DR
Shift-DR
Exit1-DR
Update-DR Run-Test/Idle
Select-DR-Scan
Select-IR-Scan
Test-Logic-Reset
Instruction
IDCODE
Old Data New Data
Boundary Scan Register
Inactive Active
Inactive Active Inactive