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3 VMA Mode

3.9 SEM Measurement

3.9 SEM Measurement

The Spectrum Emission Mask measurement analyzes spurious signal levels in up to

six pairs of offset frequencies and relates them to the carrier power.

SEM Measurement Commands

The following commands and queries can be used to configure the measurement,

then retrieve measurement results:

The general functionality of "CONFigure" on page 2551, "INITiate" on page 2552,

"FETCh" on page 2552, "MEASure" on page 2554, and "READ" on page 2553 are

described in the section SCPI Operation and Results Query in the topic

Programming the Instrument.

Note that, in general, :CONF:<measurement> resets the specified measurement

settings to their defaults. X-Series permits the addition of the NDEFault node to the

command, which prevents a measurement preset after a measurement switch.

:CONFigure:SEMask

:CONFigure:SEMask:NDEFault

:INITiate:SEMask

:FETCh:SEMask[n]?

:MEASure:SEMask[n]?

:READ:SEMask[n]?

Remote Command Results Overview

The following table provides an overview of the results returned by the :FETCh,

:MEASure, and :READ queries listed above, according to the index value n. For

Mode-specific details, click on the appropriate link for each n value.

Offsets that are turned off (inactive) return -999.0 or NAN when their results are

queried via SCPI. The value of NAN is 9.91E+37.

n Results

1 Result summary (Offsets A - F)

Note that n = 1 returns results of 6 offsets (Offset A to F)

See "Results for n = 1" on page 1392

2 Displayed frequency domain spectrum trace data for Trace 1

See "Results for n = 2-4" on page 1393

3 Displayed frequency domain absolute limit trace data

See "Results for n = 2-4" on page 1393

4 Displayed frequency domain relative limit trace data

Vector Modulation Analyzer Mode User's &Programmer's Reference 1390

Keysight x-series Programmer's Reference

Other manuals for Keysight x-series