E5071C
870
• Lower limit (defined by the total system uncertainty
specification)
• Measurement result
• Upper limit (defined by the total system uncertainty
specification)
• Test status (PASS or FAIL). Asterisks (**) is displayed at fail
points.
Graphs
1. Upper limit line (defined by the total system uncertainty
specification)
2. Lower limit line (defined by the total system uncertainty
specification)
3. Measured value at factory (Memory trace)
4. Measured value (Data trace)
5. Parameter name (S11, S12 etc.), format (Lin, Log or Phase)
6. Device name and serial number
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