test card-mem
Issue 4 May 2002
8-423555-233-123
!
WARNING:
Since the “clear long” option clears all counters if tests pass, it is possible for
firmware counters to be cleared even when a problem exists. In some cases
customer service might degrade since calls may be routed over defective
equipment.
Action/
Object Qualifier Qualifier Description Logins Defaults
Feature
Interactions
test
card-mem
location
short
long
repeat
number
clear
schedule
Carrier location where memory card
resides: High or Critical Reliability (a or
b)
1
; duplicated (a, A, b, or B)
Option for a brief series of nondestructive
diagnostic tests.
Option for a longer, more comprehensive
test series (includes a destructive test)
How many times each test in the
sequence is repeated (1-100)
This option causes the test sequence
(short or long) to repeat until the alarm (if
any) is cleared or a single test in the
sequence fails.
2
Command is validated and then a
scheduling form displays to schedule
execution of the command. The command
is then placed in the command queue and
is executed at the specified time. The
information displayed by the command is
sent to the system printer instead of the
screen.
3
Examples:
test card-mem
test card-mem a l
test card-mem b sh r 2
test card-mem a sch
test card-mem a c
1 Carrier location required on command line
2 If no alarms are registered against the maintenance object then the test sequence is run only once. The long
clear option forces a clear of all alarms if no errors are encountered during testing. The short clear option only
clears alarms pertinent to tests in the short sequence. SEE WARNING BELOW.
3 Refer to the Report Scheduler and System Printer feature specification for more details.
init
inads
craft
Test
sequence
= short;
repeat = 1
See below
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