test memory
Issue 4 May 2002
8-459555-233-123
test memory
This command performs hardware diagnostic tests on any or all memory circuit
packs in the specified carrier. Both short and the long test are nondestructive
when testing memory.
Defaults
The cabinet default is always 1. For SPE simplex systems, the default carrier is
the “a” carrier; for SPE duplex systems, there is no default carrier. The defaults for
the remaining parameters are short with a repeat of 1.
Action/Object Qualifier Qualifier Description Logins Defaults
Feature
Interactions
test memory location
short
long
repeat
number
clear
schedule
Physical location of the memory
circuit pack: cabinet number
(optional, but always 1 if entered)
and carrier letter (either a or b for
duplex, a for simplex)
Option for a brief series of
nondestructive diagnostic tests.
Option for a longer, more
comprehensive test series (all
nondestructive for this command).
Number of times each test in the
sequence is repeated (1-100)
This option causes the test
sequence (short or long) to repeat
until the alarm (if any) is cleared or
a single test in the sequence fails.
1
Command is validated and then a
scheduling form displays to
schedule execution of the
command. The command is then
placed in the command queue and
is executed at the specified time.
The information displayed by the
command is sent to the system
printer instead of the screen.
2
Examples:
test memory
test memory a
test memory a schedule
test memory 1a2
test memory b1 sh
test memory b l r 25
test memory a l c
1 If no alarms are registered against the maintenance object then the test sequence is run only once. The long
clear option forces a clear of all alarms if no errors are encountered during testing. The short clear option only
clears alarms pertinent to tests in the short sequence.
2 Refer to the Report Scheduler and System Printer feature specification for more details.
init
inads
craft
nms
See
below
none
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