Maintenance Object Repair Procedures
555-233-123
10-1094 Issue 4 May 2002
Memory Functional Test (#332)
This test is destructive.
This test ensures that every DRAM memory location can be accessed and
changed independently. Running this test wipes out all data in DRAM memory.
This test is performed during a reset system 4 or reset system 5. If the test fails
during reset system, refer to the “Procedure for SPE-Down Mode” section of
Chapter 4, ‘‘Initialization and Recovery’’, for the maintenance strategy.
Memory Board Check Test (#631)
This test always passes.
Table 10-414. TEST #332 Memory Functional Test
Error
Code
Tes t
Result Description/Recommendation
1000 ABORT System resources required to run this test are not available.
1. Repeat the command at 1-minute intervals a maximum of
three times.
1029
2014
2015
2016
2017
2018
2020
2022
2024
2025
2051
ABORT Refer to “STBY-SPE” for a description of these error codes.
FAIL The Standby SPE Memory is defective.
1. Repeat the command at 1-minute intervals a maximum of 5
times.
2. The Processor circuit pack should be replaced.
PASS The Standby SPE Memory circuit pack(s) is healthy.
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