Avaya Definity SI - Page 1494

Maintenance Object Repair Procedures
555-233-123
10-708 Issue 4 May 2002
Notes:
a. When running the Long Test Sequence on Duplication Interface circuit
pack A, the results of Test #273 may overwrite the results of Test #274.
b. Refer to SHDW-CIR (Common Shadow Circuit) for a description of this
test.
c. Refer to SPE-SELEC (SPE Select Switch) for a description of this test.
Table 10-260. System Technician-Demanded Tests: DUPINT
Order of Investigation Short Test Sequence Long Test Sequence D/ND
1
1 D = Destructive, ND = Non-destructive
Active Standby Active Standby
Duplication Interface Circuit Pack Status
Query Test (#315)
XXXXND
Duplication Interface Circuit Pack Sanity
Maze Test (#277)
XXXXND
Duplication Interface Circuit Pack SPE A
Loop Back Test (#275)
XXXXND
Duplication Interface Circuit Pack SPE B
Loop Back Test (#276)
XXXXND
Duplication Interface Circuit Pack
Administration Terminal Loop Back Test
(#274)(a)
XXXXND
Inter-Duplication Interface Circuit Pack
Loop Back Test (#280)
XXXXND
Duplication Interface Circuit Pack
Background Test Query Test (#271)
XXXXND
Duplication Interface Circuit Pack Invalid
Message Query Test (#272)
XXXXND
Common Shadow Circuit Fiber Cable
Present Test (#1289) (b)
XXXXND
Common Shadow Circuit M-BUS
Time-out Query Test (#285) (b)
XXND
Common Shadow Circuit Loop Back Test
(#283) (b)
XXND
Common Shadow Circuit Address
Decoder Test (#284) (b)
XXND
SPE Select Switch Query Test (#278) (c) X X X X ND
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