Avaya Definity SI - Page 1876

Maintenance Object Repair Procedures
555-233-123
10-1090 Issue 4 May 2002
Error Log Entries and Test to Clear Values
Notes:
a. The “clear” option can replace the “repeat” option in test memory. For a
High or Critical Reliability system, the carrier (a or b) must be specified. In
all other systems, there is no need to specify the carrier.
b. The Read All Memory Test (#85) failed. Refer to the FAIL section of this
test. The error is associated with MEM-BD 1.
c. The Memory Error Detection Test (#87) failed. Refer to the FAIL section of
this test. The error is associated with MEM-BD 1.
d. The Text Checksum Test (#86) failed. Refer to the FAIL section of this test.
The error is associated with MEM-BD 1 and is an ON board alarm.
e. There are Functional Test errors against both the Processor circuit pack
and Memory. This test is run only on the Standby SPE in a High or Critical
Reliability system. On other systems or on the Active SPE, the test is run
only via a reset system 4 or a reset system 5.
Table 10-410. MEM-BD (Memory) Memory Error Log Entries
Error Type
Aux
Data Associated Test
Alarm
Level
On/Off
Board Test to Clear Value
0
1
1 Run the Short Test Sequence first. If all tests pass, run the Long Test Sequence. Refer to the
appropriate test description and follow the recommended procedures.
0 Any Any Any test memory a/b l r 1
1-256 Any Read All Memory Test
(#85)
MAJOR ON test memory a/b l r 5
257-512 (b) Any Read All Memory Test
(#85)
MAJOR ON test memory a/b l r 1
513 (c) 0 Memory Detection/
Test (#87)
MAJOR ON test memory a/b r 3
769 (d) Any Text Checksum Test
(#86)
MAJOR OFF/ON test memory a/b l r 2
1025 (e) Any Memory Functional
Test (#332)
MAJOR ON test memory a/b l r 1
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