MEM-BD (Memory)
Issue 4 May 2002
10-1091555-233-123
System Technician-Demanded Tests: Descriptions
and Error Codes
Always investigate errors in the order in which they are presented in Table
10-411. By clearing error codes associated with the Read All Memory Test, for
example, you may also clear errors generated from other tests in the testing
sequence.
Notes:
a. Refer to PROCR (Processor) Maintenance documentation for a description
of these tests [386 systems only].
b. Refer to PR-MAINT (Maintenance/Tape Processor) Maintenance
documentation for a description of these tests [386 systems only].
c. This test is run only on the Standby SPE in a High or Critical Reliability
system. On other systems or on the Active SPE, the test is run only via a
reset system 4 command or a reset system 5 command.
Table 10-411. MEM-BD (Memory) Order of Investigation
Order of Investigation
Short Test
Sequence
Long Test
Sequence
D/
ND
1
1 D = Destructive; ND = Nondestructive
Processor Non-maskable Interrupt Test (#82)(a) X X ND
Processor ROM Checksum Test (#80) (a) X X ND
Processor Software Initiated Interrupt Test (#77) (a) X X ND
Processor Sanity Timer Test (#83) (a) X D
MTP Outpulse Relay Test (#102) (b) X X ND
MTP Analog Loop Around Test (#103) (b) X X ND
MTP Sanity Handshake Test (#106) (b) X X ND
MTPSAT Loop Around Test (#228) (b) X X ND
MTP Aux Loop Around Test (#229) (b) X X ND
MTP Reset Test (#101) (b) X D
MTP Dual Port Ram Test (#104) (b) X D
Read All Memory Test (#85) X ND
Memory Error Detection Test (#87) X X ND
Text Checksum Test (#86) X ND
Memory Functional Test (#332) (c) X D
Memory Board Check Test (#631) X X ND
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