MPC5604B/C Microcontroller Reference Manual, Rev. 8
656 Freescale Semiconductor
Table 27-14. CFLASH_LML field descriptions
Field Description
LME Low/Mid address space block Enable
This bit is used to enable the Lock registers (TSLK, MLK1-0 and LLK15-0) to be set or
cleared by registers writes.
This bit is a status bit only. The method to set this bit is to write a password, and if the
password matches, the LME bit will be set to reflect the status of enabled, and is enabled
until a reset operation occurs. For LME the password 0xA1A11111 must be written to the
CFLASH_LML register.
0 Low Address Locks are disabled: TSLK, MLK1-0 and LLK15-0 cannot be written.
1 Low Address Locks are enabled: TSLK, MLK1-0 and LLK15-0 can be written.
TSLK Test/Shadow address space block LocK
This bit is used to lock the block of Test and Shadow Address Space from Program and
Erase (Erase is any case forbidden for Test block).
A value of 1 in the TSLK register signifies that the Test/shadow sector is locked for Program
and Erase.
A value of 0 in the TSLK register signifies that the Test/shadow sector is available to receive
program and erase pulses.
The TSLK register is not writable once an interlock write is completed until
CFLASH_MCR[DONE] is set at the completion of the requested operation. Likewise, the
TSLK register is not writable if a high voltage operation is suspended.
Upon reset, information from the TestFlash block is loaded into the TSLK register. The TSLK
bit may be written as a register. Reset will cause the bit to go back to its TestFlash block
value. The default value of the TSLK bit (assuming erased fuses) would be locked.
TSLK is not writable unless LME is high.
0: Test/Shadow Address Space Block is unlocked and can be modified (also if
CFLASH_SLL[STSLK] = 0).
1: Test/Shadow Address Space Block is locked and cannot be modified.
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