EasyManua.ls Logo

Schweitzer Engineering Laboratories SEL-751 - Figure 10.12 Sample Compressed ASCII HIF Summary; Figure 10.13 Sample HIF Event History

Schweitzer Engineering Laboratories SEL-751
934 pages
Print Icon
To Next Page IconTo Next Page
To Next Page IconTo Next Page
To Previous Page IconTo Previous Page
To Previous Page IconTo Previous Page
Loading...
10.33
Date Code 20170927 Instruction Manual SEL-751 Relay
Analyzing Events
High-Impedance Fault (HIF) Event Reporting
High-Impedance Fault
Event History
The HIF event history gives you a quick look at recent relay activity. See
Figure 10.13 for a sample event history. The HIF event history contains the
following:
Standard report header
Relay and terminal identification
Date and time of report
Event reference number
Event date and time
Event type
Downed Conductor
Settings Group
The event types and downed conductor status in the event history are
determined in the same manner as in the event summary (see High-Impedance
Fault Event Summary on page 10.30). As shown in Figure 10.13, the event
history report indicates events stored in relay nonvolatile memory. The relay
places a blank row in the history report output; items that are above the blank
row are available for viewing (use the CEV HIF command). Items that are
=>>CSUM HIF <Enter>
"FID","0143"
"FID=SEL-751-X141-V0-Z001001-D20110315","08A3"
"REF_NUM","MONTH","DAY","YEAR","HOUR","MIN","SEC","MSEC","0D66"
10033,3,16,2011,15,57,17,900,"0588"
"EVENT","HIF PHASE","DOWNED CONDUCTOR","FREQUENCY","BREAKER","0F5A"
"HIF Fault","A,B","NO",59.99,"OPEN","086B"
"IARMS_PF","IBRMS_PF","ICRMS_PF","IARMS","IBRMS","ICRMS","0E6D"
28439.0,0.0,0.0,-24497.0,0.0,0.0,"063D"
"ISMA_PF","ISMB_PF","ISMC_PF","ISMA","ISMB","ISMC","0C81"
28443.0,0.0,0.0,-24493.0,0.0,0.0,"0634"
"SDIA_PF","SDIB_PF","SDIC_PF","SDIA","SDIB","SDIC","0C4B"
28440.0,0.0,0.0,-24496.0,0.0,0.0,"0634"
Where *_PF denotes pre-trigger analogs.
=>>
Figure 10.12 Sample Compressed ASCII HIF Summary
=>>HIS HIF <Enter>
SEL-751 Date: 03/17/2011 Time: 09:51:02.729
FEEDER RELAY Time Source: Internal
FID=SEL-751-X141-V0-Z001001-D20110315
# DATE TIME EVENT DOWNED CONDUCTOR GRP
10012 03/14/2011 10:09:48.011 HIF Fault A,B YES 1
10011 03/14/2011 10:07:47.950 HIF Fault A,B NO 1
10010 03/11/2011 14:14:56.033 HIF Fault A,B NO 1
10009 03/08/2011 16:43:28.151 HIF Ext. TRI NO 1
10008 03/08/2011 16:39:59.510 HIF Ext. TRI NO 1
10007 03/08/2011 16:37:58.913 HIF Ext. TRI NO 1
10006 03/08/2011 14:24:41.643 HIF Ext. TRI NO 1
10005 03/08/2011 14:19:57.743 HIF Ext. TRI NO 1
10004 03/08/2011 13:51:03.106 HIF Ext. TRI NO 1
10003 03/08/2011 13:48:48.230 HIF Ext. TRI NO 1
10002 03/08/2011 13:47:20.440 HIF Ext. TRI NO 1
10001 03/08/2011 13:44:20.023 HIF Ext. TRI NO 1
10000 03/08/2011 13:29:35.196 HIF Ext. TRI NO 1
=>>
Figure 10.13 Sample HIF Event History

Table of Contents

Related product manuals