6/02
6-81
DC1632/2240
dC612
General Procedures and Information
Prelaunch Training/Review
22 Binary/Highlight PG
LUT: C-TRA OFF IOT
OFF
(Highlight gradation check) Gradation pattern for highlight adjustment LUT:
C-TRA OFF IOT OFF
In the gradation reproducibility of Primary color/Secondary color/
Tertiary color, the highlight parts easily varied can be checked in
details. For checking TRC.
IPS
23 Binary/Highlight PG
LUT: C-TRA OFF IOT
ON
(Highlight gradation check) Gradation pattern for highlight adjustment LUT:
C-TRA OFF IOT ON
In the gradation reproducibility of Primary color/Secondary color/
Tertiary color, the highlight parts easily varied can be checked in
details. For checking TRC.
IPS
24 Binary/Highlight PG
LUT: C-TRA ON IOT
OFF
(Highlight gradation check) Gradation pattern for highlight adjustment LUT:
C-TRA ON IOT OFF
In the gradation reproducibility of Primary color/Secondary color/
Tertiary color, the highlight parts easily varied can be checked in
details. For checking TRC.
IPS
25 Binary/Highlight PG
LUT: C-TRA ON IOT
ON
(Highlight gradation check) Gradation pattern for highlight adjustment LUT:
C-TRA ON IOT ON
In the gradation reproducibility of Primary color/Secondary color/
Tertiary color, the highlight parts easily varied can be checked in
details. For checking TRC.
IPS
26 IIT/FS Incre/Gradation (For separating troubles) Fast Scan direction gradation YMC process BK
pattern
For development.
Determine the defect locations when IPS defect and ASIC poor
installation etc. has occurred.
IPS
27 IIT/SS Incre/Gradation (For separating troubles) Slow Scan direction gradation YMC process BK
pattern
For development.
Determine the defect locations when IPS defect and ASIC poor
installation etc. has occurred.
IPS
28 Shading Data Output (For separating troubles) Shading RAM data output pattern For development.
Determine the defect locations when IPS defect and ASIC poor
installation etc. has occurred.
IPS
29 COSAC Count Mode/
YMCK Vertical Stripe
(For separating troubles) 10.84mm width YMCK Vertical Stripe Pattern For separating troubles. It determines the defective locations when
an error image was output. Normal: Pre IPS Asic onwards can be
determined as normal.
IPS
30 COSAC Count Mode/8
Gradation Patch
(For separating troubles) 21.67x10.84mm 8 Gradation Patch Pattern For development.
Determine the defect locations when IPS defect and ASIC poor
installation etc. has occurred.
IPS
31 COSAC Solid PG ALL
AAh
(For development) Entire Solid Data Pattern. For development.
Determine the defect locations when IPS defect and ASIC poor
installation etc. has occurred.
IPS
32 AES L* Pass Check (For separating troubles) 32.51mm Grey + 10.84mm White, Vertical Stripe
Pattern.
For development.
Determine the defect locations when IPS defect and ASIC poor
installation etc. has occurred.
IPS
33 VIPER Grid/4C (For development) 10.84mm Grid Pattern. For development.
Determine the defect locations when IPS defect and ASIC poor
installation etc. has occurred.
IPS
34 VIPER Grid/BW (For development) 10.84mm Grid Pattern. For development.
Determine the defect locations when IPS defect and ASIC poor
installation etc. has occurred.
IPS
35 FSRE Count Mode/
Grid
(For separating troubles) 5.42mm YMCK Grid Pattern. For separating troubles. It determines the defective locations when
an error image was output. Normal: Pre IPS Asic onwards can be
determined as normal.
IPS
36 FSRE Count Mode/
Slanting Grid
(For separating troubles)5.42mm YMCK Slanting Grid Pattern. For development.
Determine the defect locations when IPS defect and ASIC poor
installation etc. has occurred.
IPS
Table 1 Test Patterns
Patte
rn # Pattern Name Overview Purpose Location