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Agilent Technologies InfiniiVision 5000 Series Programmer's Guide

Agilent Technologies InfiniiVision 5000 Series
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302 Agilent InfiniiVision 5000 Series Oscilloscopes Programmer's Guide
5 Commands by Subsystem
:MEASure:TEDGe
(see page 658)
Query Syntax
:MEASure:TEDGe? <slope><occurrence>[,<source>]
<slope> ::= direction of the waveform. A rising slope is indicated by a
space or plus sign (+). A falling edge is indicated by a
minus sign (-).
<occurrence> ::= the transition to be reported. If the occurrence number
is one, the first crossing from the left screen edge is
reported. If the number is two, the second crossing is
reported, etc.
<source> ::= {CHANnel<n> | FUNCtion | MATH}
<n>::={1|2|3|4}forthefour channel oscilloscope models
<n> ::= {1 | 2} for the two channel oscilloscope models
When the :MEASure:TEDGe query is sent, the displayed signal is searched
for the specified transition. The time interval between the trigger event
and this occurrence is returned as the response to the query. The sign of
the slope selects a rising (+) or falling (-) edge. If no sign is specified for
the slope, it is assumed to be the rising edge.
The magnitude of occurrence defines the occurrence to be reported. For
example, +3 returns the time for the third time the waveform crosses the
midpoint threshold in the positive direction. Once this crossing is found,
the oscilloscope reports the time at that crossing in seconds, with the
trigger point (time zero) as the reference.
If the specified crossing cannot be found, the oscilloscope reports
+9.9E+37. This value is returned if the waveform does not cross the
specified vertical value, or if the waveform does not cross the specified
vertical value for the specific number of times in the direction specified.
You can make delay and phase measurements using the MEASure:TEDGe
command:
Delay = time at the nth rising or falling edge of the channel - time at
the same edge of another channel
Phase = (delay between channels / period of channel) x 360
For an example of making a delay and phase measurement, see
":MEASure:TEDGe Code" on page 303.
If the optional source parameter is specified, the current source is
modified.
NOTE
This query is not available if the source is FFT (Fast Fourier Transform).

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Agilent Technologies InfiniiVision 5000 Series Specifications

General IconGeneral
BrandAgilent Technologies
ModelInfiniiVision 5000 Series
CategoryTest Equipment
LanguageEnglish

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